Alberto Tosi was born in 1975 in Borgomanero (Italy). He graduated summa cum laude in Electronics Engineering in 2001 and he received the Ph.D. degree in Information Technology Engineering in 2005, both at Politecnico di Milano (Italy). Since 2006 he is assistant professor at the Department of Electronics of Politecnico di Milano. In 2004 he was a summer student at IBM T. J. Watson Research Center, Yorktown Heights, NY, working on the experimental investigation and testing of VLSI CMOS circuits by means of single-photon detectors and imaging arrays. He currently works on visible and near-infrared single-photon detectors (Silicon, Germanium and InGaAs detectors) and the related electronics for high-resolution timing applications.