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职业迁徙
个人简介
Have developed thin film technologies (CIGS and CdTe photovoltaics) and semiconductor process equipment (Cu plating and polishing for IC back-end interconnect, thin film deposition) through the years. Currently working on a novel technology to measure electrical property depth profiles of thin films at sub-nm-level depth resolution. Technique measures mobility, carrier concentration and resistivity as a function of depth for materials such as Si, Ge, SiGe, GaAs, SiC, GaN, etc.
研究兴趣
论文共 382 篇作者统计合作学者相似作者
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Yavuz Atasoy,Emin Bacaksiz,Ali Ciris,Mehmet Ali Olgar,Recep Zan, Ahmed M. J. Al-dala Ali,Tayfur Kucukomeroglu,Bulent M. Basol
SOLAR ENERGY (2024)
OPTICAL MATERIALS (2024): 115138
Journal of materials science Materials in electronicsno. 27 (2023)
Journal of Physics Dno. 19 (2023): 195302-195302
MRS advancesno. 36 (2023): 1326-1330
JOURNAL OF PHYSICS D-APPLIED PHYSICSno. 19 (2023)
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICSno. 25 (2023): 1-8
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作者统计
#Papers: 383
#Citation: 12009
H-Index: 51
G-Index: 78
Sociability: 6
Diversity: 1
Activity: 18
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