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Chih-Yuan Lu

Emerging Central Lab, Macronix International Co., Ltd., Park, Hsinchu 300, Taiwan, ROC

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Statistical Analysis of Bit-Errors Distribution for Reliability of 3-D NAND Flash Memories

Nian-Jia Wang, Kuan-Yi Lee, Hsin-Yi Lin, Wei-Hao Hsiao, Ming-Yi Lee, Li-Kuang Kuo, Ding-Jhang Lin, Yen-Hai Chao,Chih-Yuan Lu

2020 IEEE International Reliability Physics Symposium (IRPS), pp.1-5, (2020)

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Impact of Asymmetric Memory Hole Profile on Silicon Selective Epitaxial Growth in 3D NAND Memory : AEPM: Advanced Equipment Processes and Materials

Yao-Yuan Chang, Zusing Yang,Ming-Tsung Wu,Hong-Ji Lee,Nan-Tzu Lian,Tahone Yang,Kuang-Chao Chen,Chih-Yuan Lu

advanced semiconductor manufacturing conference, (2020)

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An Approach of 3D NAND Flash Based Nonvolatile Computing-In-Memory (nvCIM) Accelerator for Deep Neural Networks (DNNs) with Calibration and Read Disturb Analysis

Po-Kai Hsu,Pei-Ying Du, Chieh Roger Lo,Hang-Ting Lue,Wei-Chen Chen,Tzu-Hsuan Hsu,Teng-Hao Yeh,Chih-Chang Hsieh, Ming-Liang Wei, Keh-Chung Wang,Chih-Yuan Lu

international memory workshop, (2020)

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Oval-Shaped OP-Layer Hole Etching: Shape Deformation, Local Arcing, and Hole Bridging Improvements

Zusing Yang, Yao-Yuan Chang,Ming-Tsung Wu,Hong-Ji Lee,Nan-Tzu Lian,Tahone Yang,Kuang-Chao Chen,Chih-Yuan Lu

advanced semiconductor manufacturing conference, (2020)

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Performance Enhancement of 3-D NAND Flash Featuring a Two-Step Dummy Wordline Program Waveform and Pair-Bitline Program Scheme

Wei-Chen Chen,Hang-Ting Lue,Chih-Chang Hsieh,Keh-Chung Wang,Chih-Yuan Lu

IEEE Transactions on Electron Devices, no. 1 (2020): 99-104

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A Novel Confined Nitride-Trapping Layer Device for 3-D NAND Flash With Robust Retention Performances

Chung-Hao Fu,Hang-Ting Lue,Tzu-Hsuan Hsu,Wei-Chen Chen, Guan-Ru Lee, Chia-Jung Chiu, Keh-Chung Wang,Chih-Yuan Lu

IEEE Transactions on Electron Devices, no. 3 (2020): 989-994

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Impacts and solutions of nonvolatile-memory-induced weight error in the computing-in-memory neural network system

Yu-Hsuan Lin,Dai-Ying Lee, Chao-Hung Wang, Ming-Liang Wei,Ming-Hsiu Lee,Hsiang-Lan Lung,Kuang-Yeu Hsieh, Keh-Chung Wang,Chih-Yuan Lu

Japanese Journal of Applied Physics, (2020)

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Study of the Walk-Out Effect of Junction Breakdown Instability of the High-Voltage Depletion-Mode N-Channel MOSFET for NAND Flash Peripheral Device and an Efficient Layout Solution

Chieh Roger Lo,Teng-Hao Yeh,Wei-Chen Chen,Hang-Ting Lue, Keh-Chung Wang,Chih-Yuan Lu,Yao-Wen Chang, Yung-Hsiang Chen, Chu-Yung Liu

IRPS, pp.1-6, (2020)

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Introduction of Non-Volatile Computing In Memory (nvCIM) by 3D NAND Flash for Inference Accelerator of Deep Neural Network (DNN) and the Read Disturb Reliability Evaluation : (Invited Paper)

Hang-Ting Lue, Po-Kai Hsu, Keh-Chung Wang,Chih-Yuan Lu

2020 IEEE International Reliability Physics Symposium (IRPS), pp.1-6, (2020)

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Study of Self-Healing 3D NAND Flash with Micro Heater to Improve the Performances and Lifetime for Fast NAND in NVDIMM Applications

Tzu-Hsuan Hsu,Hang-Ting Lue,Pei-Ying Du,Wei-Chen Chen, Teng-Hao Yeh, Roger Lo,Hung-Sheng Chang, Keh-Chung Wang,Chih-Yuan Lu

international memory workshop, (2019)

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Modeling of Apparent Activation Energy and Lifetime Estimation for Retention of 3D SGVC Memory

Wei-Hao Hsiao, Nian-Jia Wang, Ming-Yi Lee, Li-Kuang Kuo, Ding-Jhang Lin, Yen-Hai Chao,Chih-Yuan Lu

2019 IEEE International Reliability Physics Symposium (IRPS), pp.1-5, (2019)

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Optimal Design Methods to Transform 3D NAND Flash into a High-Density, High-Bandwidth and Low-Power Nonvolatile Computing in Memory (nvCIM) Accelerator for Deep-Learning Neural Networks (DNN)

Hang-Ting Lue, Po-Kai Hsu, Ming-Liang Wei, Teng-Hao Yeh,Pei-Ying Du,Wei-Chen Chen, Keh-Chung Wang,Chih-Yuan Lu

international electron devices meeting, (2019)

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A Novel Double-Density Hemi-Cylindrical (HC) Structure to Produce More than Double Memory Density Enhancement for 3D NAND Flash

Hang-Ting Lue, Yu-Wei Jiang, Min-Feng Hung, Yan-Ru Su, Li-Yang Liang, Chih-Wei Hu, Chia-Jung Chiu, Keh-Chung Wang,Chih-Yuan Lu, Teng-Hao Yeh,Pei-Ying Du, Roger Lo

international electron devices meeting, (2019)

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Study of Plasma Arcing Mechanism in High Aspect Ratio Slit Trench Etching

Yao-An Chung, Cheng-Yi Lung,Yuan-Chieh Chiu,Hong-Ji Lee,Nan-Tzu Lian,Tahone Yang,Kuang-Chao Chen,Chih-Yuan Lu

2019 30TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), (2019)

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Pre-Epitaxial Plasma Etch Treatment for the Selective Epitaxial Growth of Silicon in High Aspect Ratio 3D NAND Memory

Cheng-Yi Lung, Yao-An Chung,Ming-Tsung Wu,Hong-Ji Lee,Nan-Tzu Lian,Tahone Yang,Kuang-Chao Chen,Chih-Yuan Lu

2019 30TH ANNUAL SEMI ADVANCED SEMICONDUCTOR MANUFACTURING CONFERENCE (ASMC), (2019)

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Grain Boundary Trap-Induced Current Transient in a 3-D NAND Flash Cell String

Wei-Liang Lin,Wen-Jer Tsai, C. C. Cheng,S. H. Ku,Lenvis Liu, S. W. Hwang,Tao-Cheng Lu,Kuang-Chao Chen,Tseung-Yuen Tseng,Chih-Yuan Lu

IEEE Transactions on Electron Devices, no. 4 (2019): 1734-1740

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The Impact of Forming Temperature and Voltage on the Reliability of Filamentary RRAM

G.Y. Chen,F.M. Lee,Y.Y. Lin, P.H. Tseng, K.C. Hsu, D.Y. Lee,M.H. Lee,H.L. Lung,K.Y. Hsieh, K.C. Wang,C.Y. Lu, M.C Wu

symposium on vlsi technology, (2019)

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Hot-Carrier Injection-Induced Disturb and Improvement Methods in 3D NAND Flash Memory

Wei-Liang Lin, Wen-Jer Tsai, C.C. Cheng, Chun-Chang Lu, S.H. Ku, Y.W. Chang, Guan-Wei Wu, Lenvis Liu, S.W. Hwang,Tao-Cheng Lu,Kuang-Chao Chen,Tseung-Yuen Tseng

symposium on vlsi technology, (2019)

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Investigation of Electron and Hole Lateral Migration in Silicon Nitride and Data Pattern Effects on ${V}_{{t}}$ Retention Loss in a Multilevel Charge Trap Flash Memory

Yu-Heng Liu, Ting-Chien Zhan,Tahui Wang,Wen-Jer Tsai,Tao-Cheng Lu,Kuang-Chao Chen,Chih-Yuan Lu

IEEE Transactions on Electron Devices, no. 12 (2019): 5155-5161

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Pre-Epitaxial Plasma Etch Treatment for the Selective Epitaxial Growth of Silicon in High Aspect Ratio 3D NAND Memory

Cheng-Yi Lung, Yao-An Chung, Ming-Tsung Wu, Hong-Ji Lee,Nan-Tzu Lian,Tahone Yang,Kuang-Chao Chen,Chih-Yuan Lu

advanced semiconductor manufacturing conference, (2019)

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