Home Research-feed Channel Rankings GCT THU AI TR Open Data Must Reading

views: 0

Chang, C.S.

Sign in to view more

Show Academic Trajectory

Ego Network

D-Core

Research Interests

Author Statistics

Experience

Education

Bio

None

Papers4 papers

Sort

By YearBy Citation

Study of hot-electron assisted programming for split-page 3D vertical gate (VG) NAND flash

Kuopin Chang,Hangting Lue,Chihshen Chang, Wenwei Yeh,Chihchang Hsieh,Yihsuan Hsiao,Yenhao Shih,Chihyuan Lu

(2013)

Bibtex

Design innovations to optimize the 3D stackable vertical gate (VG) NAND flash

Chunhsiung Hung,Hangting Lue, Shuonan Hung,Chihchang Hsieh,Kuopin Chang, Shihlin Huang, Tzung Shen Chen,Chihshen Chang, Wenwei Yeh,Yihsuan Hsiao,Chiehfang Chen,Yanru Chen

(2012)

Cited by9Bibtex

Study of electron and hole injection statistics of BE-SONOS NAND Flash

Hangting Lue,Tzuhsuan Hsu,S Lai,Y J Chen, K F Chen, Chester Lo, I J Huang,T T Han, M S Chen,W P Lu,C S Chang,Mingchi Liaw

Memory Workshop, pp.1-4E, (2010)

Cited by5EIWOSBibtex

Chip-level reliability study of barrier engineered (BE) floating gate (FG) Flash memory devices

Hangting Lue,Jifong Pan,C S Chang, Szuyu Wang, Y F Chang, Y C Lee,Mingchi Liaw,Y J Chen, Chester Lo, I J Huang,T T Han, M S Chen

Reliability Physics Symposium, pp.627-633, (2010)

Cited by1EIWOSBibtex

View All

Base Info Papers Patents Projects