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Christopher Hess (S’94–A’98–M’00–SM’01) received the Diploma degree in electrical engineering and the Dr.-Ing. (Ph.D.) degree in computer science from the University of Karlsruhe, Karlsruhe, Germany.
In 1992, he was a Founding Member of the Defect Diagnosis Group, University of Karlsruhe. In 1998, he joined PDF Solutions Inc., San Jose, CA, USA, where he is currently a fellow, responsible for yield and performance characterization. Since 1992, he has been involved in the design of hundreds of test chips for the microelectronics industry over 50 technologies. He has published over 50 conference and journal papers and holds about 20 patents. His current research interests include efficient merging, 3-D arrangement of experiments to minimize chip area usage, manufacturing cycle time, developing new architectures of testing equipment providing several orders of magnitude more data from high density test chips compared to testing traditional stand alone experiments, and high density test chips for scribe line applications.
Dr. Hess served as the Technical Chairman of the 2000 International Conference on Microelectronic Test Structures (ICMTS) and the General Chairman of ICMTS in 2003. He is a Senior Member of the Electron Device Society as well as a Technical Committee Member of several semiconductor manufacturing related conferences.
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