基本信息
浏览量:86
职业迁徙
个人简介
He has contributed to a number of IEEE Journals and conferences as a program committee member or as a reviewer and/or an author in the fields of neutron-induced error. He has authored more than 50 international technical papers and presentations, including 17 in the field of terrestrial neutron-induced soft-error of semiconductor devices.,Dr. Ibe was a member of the advisory committee of the MIT nuclear reactor laboratory from 1990 to 1993. He is the Asia/Pacific Chair of the JESD89 Task Group by which new standard testing methods on neutron-induced soft-error of semiconductor devices are issued based on international consensus. In 2008 he was elected as an IEEE Fellow for contributions to neutron-induced soft-error analysis for semiconductor memory devices
研究兴趣
论文共 40 篇作者统计合作学者相似作者
按年份排序按引用量排序主题筛选期刊级别筛选合作者筛选合作机构筛选
时间
引用量
主题
期刊级别
合作者
合作机构
TERRESTRIAL RADIATION EFFECTS IN ULSI DEVICES AND ELECTRONIC SYSTEMSpp.61-105, (2015)
TERRESTRIAL RADIATION EFFECTS IN ULSI DEVICES AND ELECTRONIC SYSTEMSpp.157-205, (2015)
TERRESTRIAL RADIATION EFFECTS IN ULSI DEVICES AND ELECTRONIC SYSTEMSpp.207-248, (2015)
TERRESTRIAL RADIATION EFFECTS IN ULSI DEVICES AND ELECTRONIC SYSTEMSpp.33-48, (2015)
TERRESTRIAL RADIATION EFFECTS IN ULSI DEVICES AND ELECTRONIC SYSTEMSpp.107-155, (2015)
TERRESTRIAL RADIATION EFFECTS IN ULSI DEVICES AND ELECTRONIC SYSTEMSpp.49-59, (2015)
TERRESTRIAL RADIATION EFFECTS IN ULSI DEVICES AND ELECTRONIC SYSTEMSpp.23-32, (2015)
On-Line Testing Symposiumpp.49-54, (2012)
加载更多
作者统计
合作学者
合作机构
D-Core
- 合作者
- 学生
- 导师
数据免责声明
页面数据均来自互联网公开来源、合作出版商和通过AI技术自动分析结果,我们不对页面数据的有效性、准确性、正确性、可靠性、完整性和及时性做出任何承诺和保证。若有疑问,可以通过电子邮件方式联系我们:report@aminer.cn