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Ercan Adem received the Ph.D. degree in surface physics from University of Keele, Keele, U.K., and the B. Sc. degree from London University, London, U.K‥
He is a Section Manager and Senior Member of Technical Staff in the Materials Characterization Laboratory and Spansion Flash Memory, Advanced Micro Devices, Sunnyvale, CA. He has 12 years of direct experience with Advanced Semiconductor Materials Characterization involving surface-interface analytical techniques as well as X-ray methods and played a key role in establishing these techniques. He has authored or co-authored more than 30 journal publications and over 20 conference presentations.
Dr. Adem is a member of AVS, MRS, and Metrology TWG at International SEMATECH.
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论文共 16 篇作者统计合作学者相似作者
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Ercan Adem,Matthew S Buynoski,Robert Chiu,Bryan Choo, Calvin T Gabriel, Joong Jeon, David Matsumoto,Jeffrey A Shields, Bhanwar Singh,Winny Stockwell, Wen Yu
mag(2008)
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IEEE International Symposium on Semiconductor Manufacturing conference proceedings (2006)
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#Papers: 16
#Citation: 315
H-Index: 11
G-Index: 14
Sociability: 4
Diversity: 1
Activity: 0
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