Ganggang Zhang(张钢刚)Senior Engineer

Half-rate random data phase detection circuit

王源,刘跃全,贾嵩,张钢刚,张兴

Application Date: 20150206

Double-track pre-charge logic P type full adder circuit based on time delay and double-track pre-charge logic N type full adder circuit based on time delay

贾嵩,王子一,刘黎,王源,张钢刚

Application Date: 20141205

Time delay-based double-track pre-charge logic NAND gate circuit and Time delay-based double-track pre-charge logic exclusive or gate circuit

贾嵩,王子一,刘黎,王源,张钢刚

Application Date: 20141205

LDMOS ESD device

王源,张立忠,陆光易,贾嵩,张钢刚,张兴

Application Date: 20140623

Low phase noise LC-VCO

王源,甘善良,贾嵩,张钢刚,张兴

Application Date: 20140610

Low phase noise LC-VCO

王源,甘善良,贾嵩,张钢刚,张兴

Application Date: 20140610

Low-power-consumption low-phase noise inductance capacitance voltage-controlled oscillator

王源,甘善良,贾嵩,张钢刚,张兴

Application Date: 20140530

Detection circuit for detecting process fluctuations in integrated circuit manufacturing process

何燕冬,艾雷,张钢刚,张兴

Application Date: 20140423

High speed CML latch

王源,张雪琳,贾嵩,张钢刚,张兴

Application Date: 20140311

Method and device for testing trap density and position of gate oxide layer

HE YANDONG,WEI CHAO,ZHANG GANGGANG,ZHANG XING

Application Date: 20130724

Low-power-consumption current mode logic circuit

王源,张雪琳,贾嵩,张钢刚,张兴

Application Date: 20130626

Degradation circuit for measuring threshold voltage and saturation drain current

何燕冬,艾雷,洪杰,张钢刚,张兴

Application Date: 20130624

Transient and DC synchronous triggering type power supply clamping ESD protection circuit

WANG YUAN,LU GUANGYI,CAO JIAN,JIA SONG,ZHANG GANGGANG,ZHANG XING

Application Date: 20130509

High-speed and low-power-consumption CMOS full adder and operation method thereof

贾嵩,吕世公,刘黎,王源,张钢刚

Application Date: 20130428

Threshold voltage distribution monitoring device and method of metal oxide semiconductor (MOS) tube array

何燕冬,王熙庆,张钢刚,张兴

Application Date: 20130105

Current mode sense amplifier with compensation circuit, and use method thereof

贾嵩,徐鹤卿,孟庆龙,吴峰锋,王源,张钢刚

Application Date: 20121227

Structure and method for testing temperature characteristic of MOS (Metal Oxide Semiconductor) device

何燕冬,张钢刚,刘晓彦,张兴

Application Date: 20120914

Structure and method for testing trap density of gate oxide interface

何燕冬,张钢刚,刘晓彦,张兴

Application Date: 20120829

Sensitive amplifier

JIA SONG,LIU LIMIN,XU HEQING,WU FENGFENG,WANG YUAN,ZHANG GANGGANG

Application Date: 20120801

SRAM (Static Random Access Memory) cell and memory array

贾嵩,刘俐敏,徐鹤卿,吴峰锋,王源,张钢刚

Application Date: 20120720