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职业迁徙
个人简介
Haihua Liu received the B.S. degree in applied physics from Xi'an Jiaotong University, Xi'an, China, in 2002, and he is currently working toward the Ph.D. degree in condensed matter physics at Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing, China.
His current research is investigating the strain characterization and defect analysis of semiconductor materials and devices, such as strained-Si MOSFETs, using transmission electron microscopy (TEM) and large angle convergent-beam electron diffraction (LACBED) methods.
研究兴趣
论文共 41 篇作者统计合作学者相似作者
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arXiv (Cornell University) (2023)
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Nano lettersno. 22 (2023): 10213-10220
Natureno. 7976 (2023): 988-993
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Microscopy and Microanalysisno. S1 (2022): 2002-2003
Shan Zhou, Jiahui Li,Jun Lu,Haihua Liu,Ji-Young Kim,Ahyoung Kim,Lehan Yao,Chang Liu,Chang Qian, Zachary D. Hood,Xiaoying Lin,Wenxiang Chen,
Microscopy and Microanalysisno. S1 (2022)
Microscopy and Microanalysis (2021): 3130-3131
Microscopy and Microanalysisno. S1 (2021): 2968-2969
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