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Hang-Ting Lue

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Modeling the Impact of Random Grain Boundary Traps on the Electrical Behavior of Vertical Gate 3-D NAND Flash Memory Devices

Yihsuan Hsiao,Hangting Lue,Weichen Chen,Kuopin Chang,Yenhao Shih,Bingyue Tsui,Kuangyeu Hsieh,Chihyuan Lu

Electron Devices, IEEE Transactions , no. 6 (2014): 2064-2070

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