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Prof. Ade developed a number of novel instruments and characterization methods, which include Near Edge X-ray Absorption Fine Structure (NEXAFS) microscopy, X-ray linear dichroism microscopy, X-ray photoemission microscopy, resonant x-ray reflectivity and scattering, and 13C-labeling in Secondary Ion Mass Spectrometry (SIMS) depth profiling. Their applications focus primarily on determining the composition, morphology, and structure of polymeric and electronic materials at the sub-micron spatial scale
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论文共 695 篇作者统计合作学者相似作者
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ADVANCED ENERGY MATERIALSno. 6 (2024)
Journal of materials chemistry. A, Materials for energy and sustainabilityno. 1 (2024): 113-120
Zhen Wang,Yu Guo, Xianzhao Liu, Wenchao Shu,Guangchao Han,Kan Ding,Subhrangsu Mukherjee, Nan Zhang,Hin-Lap Yip,Yuanping Yi,Harald Ade,Philip C. Y. Chow
ChemSusChempp.e202400171-e202400171, (2024)
Sung-Joo Kwon,Rajiv Giridharagopal,Justin Neu,Somayeh Kashani,Shinya E. Chen, Ramsess J. Quezada,Jiajie Guo,Harald Ade,Wei You,David S. Ginger
JOURNAL OF PHYSICAL CHEMISTRY Cno. 6 (2024): 2748-2758
Harry M. Schrickx,Somayeh Kashani, Lauren Buck,Kan Ding, Jeromy J. Rech,Lucas Q. Flagg,Ruipeng Li,Michael W. Kudenov,Wei You,Lee J. Richter,Harald Ade, Brendan T. O'Connor
Nature Reviews Materialsno. 7 (2023): 439-455
Advanced materials (Deerfield Beach, Fla.)no. 12 (2023)
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