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Hsing-Ju Lin

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Improvement of cell reliability by floating gate implantation on 1Xnm NAND flash memory

Jeng-Hwa Liao, Zong-Jie Ko, Yu-Min Lin,Hsing-Ju Lin,Jung-Yu Hsieh,Ling-Wu Yang,Tahone Yang,Kuang-Chao Chen,Chih-Yuan Lu

Solid-state Electronics, (2018): 39-43

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Study of charge trapping characteristics of SONOS with various trapping layers using gate-sensing and channel-sensing (GSCS) method

Jenghwa Liao,Hsingju Lin,Hangting Lue,Peiying Du,Jungyu Hsieh,Lingwu Yang,Tahone Yang,Kuangchao Chen,Chihyuan Lu

Solid-state Electronics, (2013)

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Physical and electrical characteristics of silicon oxynitride films with various refractive indices

Jeng-Hwa Liao,Jung-Yu Hsieh,Hsing-Ju Lin,Wei-Yao Tang,Chun-Ling Chiang,Yun-Shan Lo,Tai-Bor Wu,Ling-Wu Yang,Tahone Yang,Kuang-Chao Chen,Chih-Yuan Lu

Journal of Physics D-applied Physics, no. 17 (2009)

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