Phang, J.C.H.

Centre for Integrated Circuit Failure Anal. & Reliability, Nat. Univ. of Singapore, Singapore|c|

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Application and modeling of single contact electron beam induced current technique on multicrystalline silicon solar cells

L Meng, A G Street,J C H Phang,C S Bhatia

SOLAR ENERGY MATERIALS AND SOLAR CELLS, (2015): 143-147

Cited by1Bibtex

Single contact electron beam induced current technique for solar cell characterization

Meng, L.,Street, A.G.,Phang, J.C.H.,Bhatia, C.S.

Photovoltaic Specialists Conference, pp.0951-0955, (2013)

EIWOSBibtex

Negative backside thermoreflectance modulation of microscale metal interconnects

Teo, J.K.J.,Chua, C.M.,Koh, L.S.,Phang, J.C.H.

Electronics Letters, no. 14 (2011): 821-822

EIWOSBibtex

Backside reflectance modulation of microscale metal interconnects

Teo, J.K.J.,Chua, C.M.,Koh, L.S.,Phang, J.C.H.

Reliability Physics Symposium, pp.FA.4.1-FA.4.6, (2011)

EIWOSBibtex

Characterization of hydrogenated amorphous silicon thin-film solar cell defects using optical beam induced current imaging and focused ion beam cross-sectioning technique

L Meng, Steven E Steen, C K Koo,C S Bhatia,A G Street, P K Joshi, Y H Kim,J C H Phang

(2011)

Bibtex

N-channel metal-oxide-semiconductor characterization with static and dynamic backside laser reflectance modulation techniques

J K J Teo, C M Chua, L S Koh,J C H Phang

Applied Physics Letters, (2011)

Cited by1Bibtex

Determination of the local electric field strength by Energy dispersive Photon Emission Microscopy

Geinzer, T.,Heiderhoff, R.,Phang, J.C.H.,Balk, L.J.

Reliability Physics Symposium, pp.271-276, (2010)

Cited by3EIWOSBibtex

Development, characterization and interface engineering of films for enhanced amorphous silicon solar cell performance

Pooran Chandra Joshi,Steven E Steen,K Sivakumar,W K Yang,S M Rossnagel, S Mittal,Myles A Steiner,Deborah A Neumayer,Y H Kim,D Nagalingam,Lingkuan Meng,C S Bhatia

Photovoltaic Specialists Conference, pp.003686-003691, (2010)

Cited by3EIWOSBibtex

SEAM and EBIC studies of morphological and electrical defects in polycrystalline silicon solar cells

Lijian Meng,D Nagalingam,C S Bhatia,A G Street,J C H Phang

Reliability Physics Symposium, pp.503-507, (2010)

Cited by2EIWOSBibtex

Determination of the local electric field strength near electric breakdown

Geinzer, T.,Heiderhoff, R.,Phang, J.C.H.,Balk, L.J.

Physical and Failure Analysis of Integrated Circuits, pp.1-6, (2010)

Cited by2EIWOSBibtex

Reliable and accurate temperature measurement using scanning thermal microscopy with double lock-in amplification

H W Ho, X H Zheng,J C H Phang,L J Balk

(2009)

Cited by1Bibtex

Electron beam induced temperature oscillation for qualitative thermal conductivity analysis by an SThM/ESEM-hybrid-system

Tiedemann, A.K.,Heiderhoff, R.,Balk, L.J.,Phang, J.C.H.

Montreal, QC, pp.327-332, (2009)

Cited by2EIWOSBibtex

Optical near-field probe with embedded gallium scattering center

D Isakov,Yani Zhang,L J Balk,J C H Phang

Applied Physics Letters, (2009)

Bibtex

Scanning near-field photon emission microscopy

D Isakov,T Geinzer,A Tio,J C H Phang,Ye Zhang, L J Balk

(2008)

Cited by4Bibtex

Scanning near-field photon emission microscopy

L J Balk, Yu Zhang,J C H Phang, A Tio, T Geinzer, D Isakov

(2008)

Bibtex

Determination of Intrinsic Spectra from Frontside & Backside Photon Emission Spectroscopy

S L Tan,K H Toh,D S H Chan,J C H Phang,C M Chua, L S Koh

Phoenix, AZ, pp.620-621E, (2007)

Cited by3EIWOSBibtex

Detectivity Optimization of InGaAs Photon Emission Microscope Systems

S L Tan, K H Yim,D S H Chan,J C H Phang, Y Zhou,L J Balk, C M Chua, L S Koh

(2006)

Cited by3Bibtex

DC-Coupled Laser Induced Detection System for Fault Localization in Microelectronic Failure Analysis

A C T Quah, L S Koh, C M Chua, M Palaniappan,J M Chin,J C H Phang

(2006)

Cited by1Bibtex

A review of near infrared photon emission microscopy and spectroscopy

J C H Phang,D S H Chan,S L Tan,W B Len, K H Yim, L S Koh,C M Chua,L J Balk

pp.275-281 (2005)

Cited by34EIWOSBibtex

Investigation on the thermal distribution of nMOSFETs under different operation modes by scanning thermal microscopy

E Hendarto,A Altes,R Heiderhoff,J C H Phang,L J Balk

(2005)

Cited by5Bibtex

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Phang, J.C.H.Binding

Papers50 papers

Phang, J.C.H.