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My research emphasizes two main areas: i) the application of in-situ high-resolution and analytical transmission electron microscope techniques to study mechanisms of phase transformations and the structure and properties of interphase boundaries at the atomic level, and ii) the use of valence electron energy-loss spectroscopy (plasmons) to understand and determine the physical properties of nanoscale materials and interfaces. In addition to selected publications provided below, I have authored or co-authored the following books in these research areas: "Interfaces in Materials" (1997), “In-Situ Electron Microscopy” (2012), and “Transmission Electron Microscopy and Diffractometry of Materials” (4th edition 2013).
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论文共 169 篇作者统计合作学者相似作者
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Acta Materialia (2023): 118567-118220
CRC Press eBookspp.277-287, (2023)
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PHYSICAL REVIEW MATERIALSno. 2 (2023)
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canadano. Supplement_1 (2023): 620-621
Md Shafkat Bin Hoque,Ian A. Brummel,Eric R. Hoglund, C. Jaymes Dionne,Kiumars Aryana,John A. Tomko,John T. Gaskins, Daniel Hirt,Sean W. Smith,Thomas Beechem,James M. Howe,Ashutosh Giri,
Physical Review Materialsno. 2 (2023)
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Microscopy and Microanalysisno. S1 (2022): 1682-1683
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