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Kai Ni
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IEEE Micro, no. 6 (2020): 33-48
IEEE ELECTRON DEVICE LETTERS, no. 9 (2020): 1348-1351
FRONTIERS IN NEUROSCIENCE, (2020): 634
2020 21st International Symposium on Quality Electronic Design (ISQED), pp.317-322, (2020)
2020 IEEE International Reliability Physics Symposium (IRPS), pp.1-5, (2020)
Xiaoming Chen,Kai Ni,Michael T. Niemier, Dayane Reis, Xiaoyu Sun, Panni Wang,Suman Datta,Xiaobo Sharon Hu, Xunzhao Yin,Matthew Jerry,Shimeng Yu, Ann Franchesca Laguna
IEEE Design & Test, no. 1 (2020): 79-99
ASP-DAC, pp.401-406, (2020)
2020 IEEE International Reliability Physics Symposium (IRPS), pp.1-5, (2020)
IEEE Transactions on Electron Devices, no. 7 (2020): 2785-2792
ISCAS, pp.1-5, (2020)
Applied Physics Letters, no. 20 (2019): 202903
IEEE Transactions on Circuits and Systems I: Regular Papers, no. 5 (2019): 1780-1793
Proceedings of the 56th Annual Design Automation Conference 2019, pp.82, (2019)
international electron devices meeting, (2019)
international electron devices meeting, (2019)
international electron devices meeting, (2019)
international electron devices meeting, (2019)
DRC, pp.247-248, (2019)
Insik Yoon, Muya Chang,Kai Ni,Matthew Jerry,Samantak Gangopadhyay, Gus Henry Smith, Tomer Hamam,Justin Romberg,Vijaykrishnan Narayanan,Asif Khan,Suman Datta,Arijit Raychowdhury
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, no. 2 (2019): 132-141
Dayane Reis,Kai Ni, Wriddhi Chakraborty, Xunzhao Yin,Martin Trentzsch, Stefan Dünkel Dünkel, Thomas Melde, Johannes Müller, Sven Beyer,Suman Datta,Michael T. Niemier,Xiaobo Sharon Hu
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, no. 2 (2019): 103-112
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