基本信息
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个人简介
PhD in Electrical Engineering with specialization in digital semiconductor design for test (DFT) and test generation techniques, with also 10+ years of experience in analog product and test engineering. Extensive experience with automatic test pattern generation tools and methodologies. Have developed and deployed enterprise-wide big data applications which integrate information from design, manufacturing, and business intelligence data sources. Excellent background in computation on both UNIX, PC and load sharing platforms. Programming experience in C, Perl, awk, and UNIX shell scripting languages. Multi-year experience with Tibco Spotfire and associated R and Iron Python extensions, and also SQL and Oracle database development and administration.
Specialties: Design for testability, test generation, digital and analog product engineering, reliability, outlier techniques, data analytics and data mining
Specialties: Design for testability, test generation, digital and analog product engineering, reliability, outlier techniques, data analytics and data mining
研究兴趣
论文共 106 篇作者统计合作学者相似作者
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PROCEEDINGS 2016 IEEE INTERNATIONAL TEST CONFERENCE (ITC)pp.1-10, (2016)
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibitionpp.1042-1047, (2015)
Sukeshwar Kannan,Kaushal Kannan,Bruce C. Kim,Friedrich Taenzler,Richard Antley, Ken Moushegian,Kenneth M. Butler, Doug Mirizzi
Journal of Electronic Testingno. 6 (2013): 745-762
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