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Bio
Kyomin Sohn (kyomin.sohn@samsung.com) is Samsung Master (VP of technology) at Samsung Electronics in Hwaseong, Gyeonggi-do, South Korea and responsible for future architecture and circuits for DRAM. He received his B.S. and M.S. degrees in electrical engineering in 1994 and 1996, respectively, from Yonsei University, Seoul, Korea. From 1996 to 2003, he was with Samsung Electronics, Korea, involved in the SRAM Design Team. He designed various high-speed SRAMs for external cache and buffer memory. He received his Ph.D. degree in electrical engineering and computer science in 2007 from KAIST, Daejeon, Korea. He rejoined Samsung Electronics in 2007, where he has been involved in the DRAM Design Team. His research interests include next-generation 3D DRAM; reliable memory design; and memory subsystems, including processing-in-memory for artificial intelligence applications. In addition, he has served as a Technical Program Committee member for the Symposium on VLSI Circuits since 2012.
Research Interests
Papers共 63 篇Author StatisticsCo-AuthorSimilar Experts
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Sungmin Yun,Kwanhee Kyung, Juhwan Cho,Jaewan Choi, Jongmin Kim,Byeongho Kim, Sukhan Lee,Kyomin Sohn,Jung Ho Ahn
Annual IEEE/ACM International Symposium on Microarchitecturepp.1429-1443, (2024)
Symposium on VLSI Technologypp.1-2, (2024)
Byeongho Kim,Sanghoon Cha, Sangsoo Park,Jieun Lee,Sukhan Lee,Shin-haeng Kang,Jinin So,Kyungsoo Kim,Jin Jung,Jong-Geon Lee,Sunjung Lee, Yoonah Paik,Hyeonsu Kim,Jin-Seong Kim,Won-Jo Lee,Yuhwan Ro,Yeongon Cho,Jin Hyun Kim,Joonho Song, Jaehoon Yu,Seungwon Lee,Jeonghyeon Cho,Kyomin Sohn
IEEE Access (2024): 160190-160204
2024 IEEE European Solid-State Electronics Research Conference (ESSERC)pp.573-576, (2024)
2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) (2023)
IEEE Solid-State Circuits Magazineno. 3 (2023): 53-61
Jin Hyun Kim,Yuhwan Ro,Jinin So,Sukhan Lee,Shin-haeng Kang,YeonGon Cho,Hyeonsu Kim,Byeongho Kim,Kyungsoo Kim, Sangsoo Park, Jin-Seong Kim,Sanghoon Cha,Won-Jo Lee,Jin Jung,Jong-Geon Lee,Jieun Lee,JoonHo Song,Seungwon Lee,Jeonghyeon Cho, Jaehoon Yu,Kyomin Sohn
2023 IEEE Hot Chips 35 Symposium (HCS)pp.1-31, (2023)
IEEE JOURNAL OF SOLID-STATE CIRCUITSno. 11 (2023): 3242-3252
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Author Statistics
#Papers: 62
#Citation: 1063
H-Index: 22
G-Index: 32
Sociability: 6
Diversity: 2
Activity: 43
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