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Matthew Brightsky
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Papers45 papers
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Ryan V Zarcone,Jesse H Engel,S Burc Eryilmaz, Weier Wan,SangBum Kim,Matthew BrightSky,Chung Lam,Hsiang-Lan Lung,Bruno A Olshausen,H -S Philip Wong
Scientific reports, no. 1 (2020): 6831
Ryan V. Zarcone,Jesse H. Engel,S. Burc Eryilmaz, Weier Wan,SangBum Kim,Matthew BrightSky,Chung Lam,Hsiang-Lan Lung,Bruno A. Olshausen,H.-S. Philip Wong
Scientific Reports, no. 1 (2020): 13404
Eduard A. Cartier,Wanki Kim, Nanbo Gong,Tayfun Gokmen,Martin M. Frank,Douglas M. Bishop, Youngseok Kim,Seyoung Kim,Takashi Ando,Ernest Y. Wu, Praneet Adusumilli,John Rozen
2019 IEEE International Reliability Physics Symposium (IRPS), pp.1-10, (2019)
M. Ishii, U. Shin, K. Hosokawa,M. BrightSky,W. Haensch,S. Kim, S. Lewis, A. Okazaki, J. Okazawa, M. Ito, M. Rasch, W. Kim
international electron devices meeting, (2019)
Journal of Physics D, no. 47 (2019): 473002
Bibtex
symposium on vlsi technology, (2019)
Bibtex
international memory workshop, (2019)
Bibtex
international memory workshop, (2019)
Bibtex
Yujun Xie,Wanki Kim, Yerin Kim,Sangbum Kim, Jemima Gonsalves,Matthew BrightSky,Chung Lam,Yu Zhu,Judy J Cha
ADVANCED MATERIALS, no. 9 (2018)
Wei-Chih Chien, Chiao-Wen Yeh, Robert L. Bruce,Huai-Yu Cheng, I. T. Kuo, Chih-Hsiang Yang,A. Ray,Hiroyuki Miyazoe,W. Kim, Fabio Carta,Erh-Kun Lai,Matthew J. BrightSky
IEEE Transactions on Electron Devices, no. 11 (2018): 5172-5179
EIWOSBibtex
C. W. Yeh,W. C. Chien,R. L. Bruce,H. Y. Cheng, I. T. Kuo, C. H. Yang,A. Ray,H. Miyazoe,W. Kim, F. Carta,E. K. Lai,M. BrightSky
symposium on vlsi technology, (2018)
Bibtex
Journal of Applied Physics, no. 11 (2018): 111101
Cited by64Bibtex
H. Y. Cheng,W. C. Chien, I. T. Kuo, C. W. Yeh,L. Gignac,W. Kim,E. K. Lai, Y. F. Lin,R. L. Bruce,C. Lavoie,C.W. Cheng,A. Ray
international electron devices meeting, (2018)
Bibtex
W. Kim, S. Kim, R. Bruce, F. Carta, G. Fraczak,A. Ray, C. Lam,M. BrightSky,Y. Zhu,T. Masuda, K. Suu, Y. Xie
IRPS, pp.6, (2018)
Huai-Yu Cheng,W.C. Chien, I. T. Kuo,Erh-Kun Lai,Yu Zhu, J. L. Jordan-Sweet,A. Ray, F. Carta, Feng-Ming Lee, P. H. Tseng,Ming-Hsiu Lee,Y. Y. Lin
international electron devices meeting, (2017)
Cited by2Bibtex
Win-San Khwa, Meng-Fan Chang,Jau-Yi Wu,Ming-Hsiu Lee,Tzu-Hsiang Su,Keng-Hao Yang,Tien-Fu Chen, Tien-Yen Wang, Hsiang-Pang Li,Matthew J. BrightSky,SangBum Kim, Hsiang-Lam Lung
J. Solid-State Circuits, no. 1 (2017): 218-228
arXiv: Information Theory, (2017)
Win-San Khwa, Meng-Fan Chang,Jau-Yi Wu,Ming-Hsiu Lee,Tzu-Hsiang Su,Keng-Hao Yang,Tien-Fu Chen, Tien-Yen Wang, Hsiang-Pang Li,M. BrightSky,SangBum Kim, Hsiang-Lam Lung
IEEE Journal of Solid-State Circuits, no. 1 (2017): 218-228
Cited by2EIWOSBibtex
IEEE Journal on Emerging and Selected Topics in Circuits and Systems, no. 2 (2016): 146-162
IEEE Transactions on Electron Devices, no. 12 (2016): 5004-5011
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