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J. Solid-State Circuits, no. 1 (2017): 218-228
EI
Technical Digest - International Electron Devices Meeting, IEDM, no. null (2013): 20.7.1-20.7.4
WOSSCOPUS
Reliability Physics Symposium, pp.6C.2.1-6C.2.6, (2012)
EIWOS
Digest of Technical Papers - Symposium on VLSI Technology, no. null (2011): 98-99
WOSSCOPUS
IEEE Electron Device Letters, no. 2 (2009): 126-129
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