Patrick J. Flynn received the B.S. in Electrical Engineering (1985), the M.S. in Computer Science (1986), and the Ph.D. in Computer Science (1990) from Michigan State University, East Lansing. He has held faculty positions at Notre Dame (1990-1991, 2001-present), Washington State University (1991-1998), and Ohio State University (1998-2001). His research interests include computer vision, biometrics, and image processing.

Dr. Flynn is an IEEE Fellow, an IAPR Fellow, and a past Associate Editor of IEEE Trans. on Information Forensics and Security, IEEE Trans. on Image Processing, IEEE Trans. on Pattern Analysis and Machine Intelligence, Pattern Recognition and Pattern Recognition Letters. He is also a past Associate Editor-in-Chief of IEEE Trans. on Pattern Analysis and Machine Intelligence. He has received outstanding teaching awards from Washington State University and the University of Notre Dame.
Elected ACM Distinguished Scientist, 2011