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Research Interests

Papers共 60 篇Author StatisticsCo-AuthorSimilar Experts

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Performance and Reliability of Technology Qualified 34 Mb Split-Gate Eflash Macro in 28 Nm HKMG
Ralf Richter,Stefan Duenkel, Bert Mueller, Frank Mauersberger, Sven Wittek,Sven Beyer, Jana Boehme, Uwe Ritter,Violetta Sessi, Zhen Xu,Maximilian Drescher, Jinho Kim,Parviz Ghazavi,Yuri Tkachev, Latt Tee, Zonglin Li,Mandana Tadayoni, Fan Luo,Nhan Do, Serguei Jourba, Catherine Decobert, Gilles Festes, Bruno Villard, Thibaut Pate-Cazal
2024 IEEE INTERNATIONAL MEMORY WORKSHOP, IMW (2024)
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Reliability Assesement of Ferroelectric Nvcap for Small-Signal Capacitive Read-Out
Omkar Phadke,Halid Mulaosmanovic,Stefan Duenkel,Sven Beyer,Shimeng Yu
2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024 (2024)
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Design Space for the Scaled Ferroelectric MirrorBit Technology for High-Density NVM Storage
Paritosh Meihar,Srinu Rowtu,Halid Mulaosmanovic,Stefan Duenkel,Sven Beyer,Udayan Ganguly
8TH IEEE ELECTRON DEVICES TECHNOLOGY & MANUFACTURING CONFERENCE, EDTM 2024pp.723-725, (2024)
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Author Statistics

#Papers: 60

#Citation: 1379

H-Index: 15

G-Index: 37

Sociability: 5

Diversity: 2

Activity: 26

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