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IEEE Transactions on Electron Devices, no. 3 (2017): 1336-1342
EIWOS
IEEE Electron Device Letters, no. 10 (2015): 1015-1017
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international electron devices meeting, (2015): 44-47
IEEE Transactions on Device and Materials Reliability, (2015)
IEEE Transactions on Device and Materials Reliability, (2015)
Ultrasound in Medicine and Biology, (2015)
IEEE Transactions on Device and Materials Reliability, (2015)
international electron devices meeting, (2015)
Memory Workshop, pp.1-4, (2014)
EIWOS
Electron Devices Meeting, pp.3.7.1-3.7.4, (2013)
EIWOS
VLSI Technology, pp.T156-T157, (2013)
EIWOS
Electron Devices Meeting, pp.2.3.1-2.3.4, (2012)
EIWOS
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