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Yi-Hsuan Hsiao

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Study of the programming sequence induced back-pattern effect in split-page 3D vertical-gate (VG) NAND flash

Weichen Chen,Hangting Lue,Kuopin Chang,Yihsuan Hsiao,Chihchang Hsieh,Yenhao Shih,Chihyuan Lu

VLSI Technology, Systems and Application, pp.1-2, (2014)

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