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Yu-Ichi Hayashi

Tohoku University,

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Efficient Algorithms for Sign Detection in RNS Using Approximate Reciprocals

Shinichi Kawamura,Yuichi Komano, Hideo Shimizu, Saki Osuka,Daisuke Fujimoto,Yu-ichi Hayashi, Kentaro Imafuku

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., no. 1 (2021): 121-134

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Segmentation method based modeling and analysis of a glass package power distribution network (PDN)

Youngwoo Kim, Daisuke Fujimoto, Shugo Kaji, Shinpei Wada,Hyunwook Park, Daehwan Lho,Joungho Kim,Yu-ichi Hayashi

Nonlinear Theory and Its Applications, IEICE, no. 2 (2020): 170-188

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Experimental Study on Measurement Resolution of Side Channel Waveform in Correlation Power Analysis

Kohei Utsumi,Yu-ichi Hayashi,Takaaki Mizuki,Hideaki Sone

international symposium on electromagnetic compatibility, (2020)

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Measurement on Effect of Controlled Wave Phase in EM Fault Injection Attack

Yuto Shinoda, Mitsuki Takenouchi,Yu-ichi Hayashi,Takaaki Mizuki,Hideaki Sone

international symposium on electromagnetic compatibility, (2020)

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Survey of Hardware Trojan Threats and Detection

Yuichi Hayashi, Shinichi Kawamura

international symposium on electromagnetic compatibility, (2020)

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Possibility of Injecting Malicious Instructions from Legitimate Communication Channels by IEMI

Masahiro Kinugawa,Yuichi Hayashi

international symposium on electromagnetic compatibility, (2020)

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Design and Evaluation of a Spark Gap Based EM-fault Injection Setup

Arthur Beckers, Masahiro Kinugawa,Yuichi Hayashi,Josep Balasch,Ingrid Verbauwhede

international symposium on electromagnetic compatibility, (2020)

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Efficient Electromagnetic Analysis Based on Side-channel Measurement Focusing on Physical Structures

Shinpei Wada,Youngwoo Kim,Daisuke Fujimoto,Yuichi Hayashi,Naofumi Homma

international symposium on electromagnetic compatibility, (2020)

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Comparison of Pearson correlation coefficient and distance correlation in Correlation Power Analysis on Digital Multiplier

Jurica Kundrata,Daisuke Fujimoto,Yu-ichi Hayashi,Adrijan Baric

MIPRO, pp.146-151, (2020)

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A method for constructing sliding windows leak from noisy cache timing information

Rei Ueno, Junko Takahashi,Yu-ichi Hayashi,Naofumi Homma

Journal of Cryptographic Engineering, pp.1-10, (2020)

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The Source Estimation of Electromagnetic Information Leakage from Information Devices

Ryota Birukawa, Daiya Nagata,Yu-ichi Hayashi,Takaaki Mizuki,Hideaki Sone

ursi general assembly and scientific symposium, (2020)

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Design Considerations for EM Pulse Fault Injection

Arthur Beckers, Masahiro Kinugawa,Yu-ichi Hayashi, Daisuke Fujimoto,Josep Balasch,Benedikt Gierlichs,Ingrid Verbauwhede

CARDIS, pp.176-192, (2019)

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A Practical Evaluation Method for EM Information Leakage by Using Audible Signal

Ryota Birukawa,Takaaki Mizuki,Hideaki Sone,Yu-ichi Hayashi

(2019)

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Method for Identifying Individual Electronic Devices Focusing on Differences in Spectrum Emissions

Shugo Kaji, Masahiro Kinugawa,Daisuke Fujimoto,Laurent Sauvage,Jean-Luc Danger,Yuichi Hayashi

international symposium on electromagnetic compatibility, (2019)

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Practical card-based implementations of Yao's millionaire protocol

Daiki Miyahara,Yu-ichi Hayashi,Takaaki Mizuki,Hideaki Sone

(2019): 207-221

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A study on an Effective Evaluation Method for EM Information Leakage without Reconstructing Screen

Ryota Birukawa,Yu-ichi Hayashi,Takaaki Mizuki,Hideaki Sone

international symposium on electromagnetic compatibility, (2019)

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Secure implementations of a random bisection cut

Itaru Ueda, Daiki Miyahara, Akihiro Nishimura,Yu-ichi Hayashi,Takaaki Mizuki,Hideaki Sone

Int. J. Inf. Sec., no. 4 (2019): 445-452

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Fundamental Study on the Effects of Connector Torque Value on the Change of Inductance at the Contact Boundary

Daisuke Fujimoto, Takashi Narimatsu,Yu-ichi Hayashi

IEICE Transactions, no. 9 (2019): 636-640

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Electromagnetic Information Extortion from Electronic Devices Using Interceptor and Its Countermeasure

Masahiro Kinugawa, Daisuke Fujimoto, Yu-ichi Hayashi

IACR Trans. Cryptogr. Hardw. Embed. Syst., no. 4 (2019): 62-90

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Statistical Test Methodology for Evaluating Electromagnetic Information Leakage From Mobile Touchscreen Devices

Ville Yli-Mayry, Daisuke Miyata,Naofumi Homma,Yuichi Hayashi,Takafumi Aoki

IEEE Transactions on Electromagnetic Compatibility, no. 4 (2019): 1107-1114

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