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A Case Study Of Ir-Drop In Structured At-Speed Testing
INTERNATIONAL TEST CONFERENCE 2003, PROCEEDINGS, pp.1098-1104, (2003)
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At-speed test has become a requirement in IC technologies below 180 nm. Unfortunately, test mode switching activity and IR-drop present special challenges to the successful application of structural at-speed tests. In this paper we characterize these problems on commercial ASICs in order to understand how to implement more effective solut...更多
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