A Multi-Converter Dft Technique For Complex Sip: Concepts And Validation

V. Kerzerho,P. Cauvet,S. Bernard,F. Azais,M. Comte,M. Renovell

2009 EUROPEAN CONFERENCE ON CIRCUIT THEORY AND DESIGN, VOLS 1 AND 2（2009）

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摘要

This paper presents a new technique called "Analog Network of Converters" that allows to test a set of ADCs and DACs embedded in a complex circuit as SiP and SoC. It presents an experimental validation of this new concept that permits to reduce drastically the testing time and requires only a low cost digital ATE.

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关键词

automatic test equipment,testing,mathematical model,sip,system in package,design for testability,soc,harmonic analysis

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