An Accurate and Comprehensive Soft Error Simulator NISES II

Y. Tosaka,S. Satoh, H. Oka

SIMULATION OF SEMICONDUCTOR PROCESSES AND DEVICES 2004（2004）

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摘要

The authors report an accurate and comprehensive soft error (SE) simulator NISES version II, which includes effects due to cosmic ray high-energy neutrons, thermal neutrons, and α - particles. NISES II covers SE analysis of DRAM, SRAM, and latch (or FF) circuits and it is also applicable for SE analysis of SOI circuits.

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关键词

Thermal Neutron,IEEE Proc,Soft Error,Pulse Neutron,Single Event Upset

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