Impact of conventional and emerging interconnects on the circuit performance of various post-CMOS devicesMarkAhmet Ceyhan[0]Azad Naeemi[0]ISQED, pp. 203-209, 2013.Cited by: 0|Bibtex|Views1|DOI:https://doi.org/10.1109/ISQED.2013.6523611EI WOS Other Links: dblp.uni-trier.de|academic.microsoft.comKeywords: CMOS integrated circuitsMOSFETcarbon nanotube field effect transistorscopperdelaysMore(29+)Code: Data: Full Text (Upload PDF)PPT (Upload PPT)SimilarReferenceCitedUpload PPTYour rating :0 TagsCommentsSubmit
