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Scanning X-ray imaging with small-angle scattering contrast
JOURNAL OF APPLIED CRYSTALLOGRAPHY, no. SUPnan (2007): S78-S82
Abstract
An X-ray scanning imaging technique using the integrated intensity of the small-angle X-ray scattering (SAXS) signal is presented. The technique is based on two-dimensional scanning of a thin sample section with an X-ray microbeam, collecting SAXS patterns at every scanning step using a two-dimensional detector. The integrated intensity w...More
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