Effect of rapid thermal annealing on photoluminescence and crystal structures of CdZnO films
Journal of Crystal Growth, pp. 1908-1911, 2010.
WOS SCOPUS EI
Hexagonal CdxZn1−xO films with low and high Cd contents (x=0.10 and 0.52) have been deposited by reactive direct-current magnetron sputtering, respectively. The as-deposited CdxZn1−xO films hardly exhibit detectable photoluminescence (PL). Once subjected to rapid thermal annealing (RTA) at sufficiently high temperatures, the CdxZn1−xO fil...More
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