Robust System Design to Overcome CMOS Reliability Challenges.

IEEE Journal on Emerging and Selected Topics in Circuits and Systems(2011)

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摘要
Today's mainstream electronic systems typically assume that transistors and interconnects operate correctly over their useful lifetime. With enormous complexity and significantly increased vulnerability to failures compared to the past, future system designs cannot rely on such assumptions. For coming generations of silicon technologies, several causes of hardware reliability failures, largely ben...
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关键词
Resilience,Robustness,Transistors,CMOS integrated circuits,Layout,Hardware
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