Fast Hierarchical Test Path Construction for Circuits with DFT-Free Controller-Datapath Interface

J. Electronic Testing, pp. 29-42, 2002.

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Abstract:

Hierarchical approaches address the complexity of test generation through symbolic reachability paths that provide access to the I/Os of each module in a design. However, while transparency behavior suitable for symbolic design traversal can be utilized for constructing reachability paths for datapath modules, control modules do not exhib...More

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