P-21: Investigation of Pattern-Induced Brightness Non-Uniformity in AMOLED Displays

Kyoung-Bo Kim,Hye-Hyang Park,Ohseob Kwon,Kil-Won Lee,Ki-Yong Lee,Jisu Ahn,Jin-Wook Seo,Su-Bin Song,Moojin Kim,TaeHoon Yang,Byoung Keon Park,Maxim Lisachenko,SeiHwan Jung, Daechul Choi,Byoung Choi,Hye-Dong Kim,HoKyoon Chung

Sid Symposium Digest of Technical Papers（2006）

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摘要

We found that pattern-induced line type brightness non-uniformity is related to moire patterns that appear when primary grain boundaries in SLS processed poly-Si are aligned over repetitive TFT patterns such as metal lines. We propose a method to diminish the Moire pattern type non-uniformity by adopting black matrix and top emission TFT structure.

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