High quality GaN grown at high growth rates by gas-source molecular beam epitaxy

Electronics Letters(1995)

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摘要
High quality GaN has been grown by gas-source molecular beam epitaxy (MBE) using ammonia as the nitrogen source. A growth rate as high as 1 /spl mu/m/h, which is an order of magnitude higher than previously reported for the growth of GaN by MBE, has been achieved. Strong reflection high-energy electron diffraction (RHEED) intensity oscillations have been observed during the growth, making in situ ...
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关键词
Gallium compounds,Epitaxial growth,Semiconductor growth,Semiconductor epitaxial layers,Charge carrier density,Charge carrier mobility,Hall effect,Photoluminescence
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