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Measurement of Dielectric Properties for Low-Loss Materials at Millimeter Wavelengths

Journal of Infrared, Millimeter, and Terahertz Waves, no. 6 (2011): 838-847

Cited by: 3|Views0
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Abstract

We describe here a system for accurate measurement of the dielectric properties of very low-loss materials in the 130 to 170 GHz frequency range. This system utilizes an open resonator with a quality factor ∼ 1 × 106. Resonance curves for this resonator are acquired with a commercial spectrum analyzer equipped with an external millimeter...More

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