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Spatially Extended Nature Of Resistive Switching In Perovskite Oxide Thin Films
APPLIED PHYSICS LETTERS, no. 6 (2006)
Abstract
The authors report the direct observation of the electric pulse induced resistance-change effect at the nanoscale on La1-xSrxMnO3 thin films by the current measurement of the atomic force microscopy (AFM) technique. After a switching voltage of one polarity is applied across the sample by the AFM tip, the conductivity in a local nanometer...More
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