Detection Of Single-Electron Charging In An Individual Inas Quantum Dot By Noncontact Atomic-Force Microscopy

Single-electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic-force microscope (AFM). The resonant frequency shift and the dissipated energy of an oscillating AFM cantilever were measured as a function of the tip-back electrode voltage, and the resulting spectra show distinct ju...更多