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Detection Of Single-Electron Charging In An Individual Inas Quantum Dot By Noncontact Atomic-Force Microscopy

PHYSICAL REVIEW LETTERS, no. 5 (2005): 056802-056802

引用116|浏览30
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Single-electron charging in an individual InAs quantum dot was observed by electrostatic force measurements with an atomic-force microscope (AFM). The resonant frequency shift and the dissipated energy of an oscillating AFM cantilever were measured as a function of the tip-back electrode voltage, and the resulting spectra show distinct ju...更多

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