The Attack of the "Holey Shmoos": A Case Study of Advanced DFD and Picosecond Imaging Circuit Analysis (PICA)

William V. Huott,Moyra K. McManus,Daniel R. Knebel,Steve Steen,Dennis Manzer,Pia Sanda,Steve Wilson,Yuen H. Chan,Antonio Pelella,Stanislav Polonsky

ITC（1999）

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摘要

This paper will provide a case study of a particularlydifficult debug problem (the Holey Shmoo problem) whichdeveloped while designing the IBM System/390 G6637MHz microprocessor chip. Resolution of this probleminvolved the use of some of today's newest DFD/DFT anddiagnostics techniques. The discussion of the HoleyShmoo problem and its debug will serve to highlight anddemonstrate some of these advanced techniques.

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关键词

propagation delay,chip,voltage,computer aided software engineering,image analysis,design for testability,cmos technology,circuit analysis,vlsi

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