A quasianalytical model for LT-GaAs and LT-Al0.3Ga0.7As MISFET devices

MICROWAVE AND OPTICAL TECHNOLOGY LETTERS(2000)

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摘要
This paper describes a quasianalytical model for the calculation of the current-voltage characteristics of LT-GaAs and LT-Al0.3Ga0.7As MISFET devices. The model is derived from basic semiconductor charge analysis. Poisson's equation, the cull ent continuity equation, and the Chang-Fetterman velocity-field equations have been solved analytically. When the devices are operating in the linear region and the knee region, the one-dimensional Poisson equation is considered. When the devices are in the saturation regime, the two-dimensional Poisson equation is solved analytically. The resulting output current-voltage characteristics are in good agreement with experimental data. This model has been used to predict the RF performance and RF power capability of these MISFETs. (C) 2000 John Wiley & Sons, Inc.
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关键词
molecular beam epitaxy (MBE),low-temperature (LT)-grown GaAs and Al0.3Ga0.7As,MISFETs,quasianalytical model
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