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Transient fault detection via simultaneous multithreading
Proceedings of the 40th Annual International Symposium on Computer Architecture, no. 2 (2000): 25-36
EI
摘要
Smaller feature sizes, reduced voltage levels, higher transistor counts, and reduced noise margins make future generations of microprocessors increasingly prone to transient hardware faults. Most commercial fault-tolerant computers use fully replicated hardware components to detect microprocessor faults. The components are lockstepped (cy...更多
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