Determination of the Gate Dielectric Capacitance of Ultrathin High-k LayersMarkSamares Kar[0]Journal of The Electrochemical Society, Volume 151, Issue 7, 2004.Cited by: 3|Bibtex|Views0|DOI:https://doi.org/10.1149/1.1759699Other Links: academic.microsoft.comCode: Data: Full Text (Upload PDF)PPT (Upload PPT)SimilarReferenceCitedUpload PPTYour rating :0 TagsCommentsSubmit
