XAFS studies of CoCr films

The XAFS spectra of CoCr films prepared at different substrate temperatures have been compared. The patterns of XANES and EXAFS of the films with high Hc⊥ (1150 Oe) and low Hc⊥ (200 Oe) were slightly different. On the assumption that CoCr films consist of Co- and Cr-rich phases, an EXAFS analysis of nearest-neighbour atoms was made for various possible fractional ratios of these phases; the reliability factor (R-factor) was smaller for the two-phase model than for the one-phase model in the high Hc⊥ films, and vice versa in the low Hc⊥ films.