Improved fault diagnosis in scan-based BIST via superposition
DAC（2000）
摘要
An improved approach for diagnosis of scan-based BIST designs is proposed. The enhancement in diagnosis is achieved by utilizing the superposition principle. Scan cells are partitioned pseudorandomly for observation and the ones provably fault free are removed from the potentially faulty list. Diagnostic resolution is improved by a novel application of the superposition principle, resulting in significant reductions in diagnosis time.
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关键词
superposition principle,significant reduction,improved approach,improved fault diagnosis,novel application,scan-based bist design,provably fault,faulty list,diagnostic resolution,diagnosis time,partitioned pseudorandomly,computer science,polynomials,compaction
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