Simple method for estimating neutron-induced soft error rates based on modified BGR model

Y. Tosaka,H. Kanata,S. Satoh, T. Itakura

IEEE Electron Device Letters（1999）

引用 59|浏览8

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摘要

Recently the importance of cosmic ray neutron-induced soft errors has been recognized. We propose a simple model to estimate the neutron-induced soft error rates (SER's), which is a modified version of the burst generation rate (BGR) model. Our model can be used to easily and quickly estimate neutron-induced soft error rates and provides a useful guideline for device and circuit engineers to estim...

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关键词

Error analysis,Neutrons,Guidelines,Logic circuits,Atmospheric modeling,Cosmic rays,Nuclear electronics,Silicon,Sea level,Circuit simulation

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