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Vapor-deposited thin films with negative real refractive index in the visible regime.
OPTICS EXPRESS, no. 10 (2009): 7784-7789
A thin film comprising parallel tilted nanorods was deposited by directing silver vapor obliquely towards a plane substrate. The reflection and transmission coefficients of the thin film were measured at three wavelengths in the visible regime for normal-illumination conditions, using ellipsometry and walk-off interferometry. The thin fil...More
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