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Atom chips in the real world: the effects of wire corrugation

EUROPEAN PHYSICAL JOURNAL D, no. 2 (2005): 171.0-180.0

Cited: 86|Views23

Abstract

We present a detailed model describing the effects of wire corrugation on the trapping potential experienced by a, cloud of atoms above a current carrying micro wire. We calculate the distortion of the current distribution due to corrugation and then derive the corresponding roughness in the magnetic field above the wire. Scaling laws are...More

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