Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs

IOLTS, pp. 117-122, 2008.

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Abstract:

In this paper, we investigate optimum Radiation Hardened By Design (RHBD) for use against Single-Event Transients (SET) using low-pass filters (LPF) including RHBD techniques against Single-Event Upsets (SEU) for sequential logic in 45-nm technology in a terrestrial environment. Three types of LPF were investigated regarding their SET pul...More

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