11.1 High-Speed Serializing/De-Serializing Design-For-Test Method for Evaluating a 1 GHz Microprocessor
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium（1998）
摘要
As microprocessor speeds approach 1 GHz and beyond the difficulties of at-speed testing continue to increase. In particular. automated test equipment which operates at these frequencies is very limited. This paper discusses a design-for-test method which serializes parallel circuit inputs and de-serializes circuit outputs to achieve 1 GHz operation on test equipment operating at frequencies helow 100 MHz. This method has been used to successfully characterize the operation of a 1 GHL microprocessor chip. [1]
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关键词
design-for-test method,microprocessor speeds approach,at-speed testing,De-Serializing Design-For-Test Method,test equipment operating,GHL microprocessor chip,frequencies helow,GHz Microprocessor,parallel circuit input,High-Speed Serializing,de-serializes circuit output,automated test equipment,GHz operation
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