A new on-chip jitter measurement method based on cumulative distribution function

The authors present a new on-chip jitter measurement method based on cumulative distribution function (CDF) to solve the problem of the mismatch of the delay line, taking up too much chip area and limited by high frequency oscillator signal, which are encountered in measuring multi-GHz clock jitter. The complete circuit is designed and implemented based on the 65 nm CMOS process. The simulation results show that the circuit is able to operate at 2.5 GHz and achieves a timing resolution up to 1 ps. © 2012 Peking University.