Research on storage life of electronic equipment based on goodness of fit test method

The test of distribution is to infer that whether the life of produce can satisfy the distribution chosen by a simple analysis of the test data or the alive using data. Based on the principle of fit goodness test and the Pearson test method, which is one of a common distribution test methods, a kind of special F test method is researched for the situation that the product life obeys to exponential distribution. With that method, the distribution of the storage life of electronic devices is researched.